101 entries « ‹ 3 of 3
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O’Malley, M L; Timp, G L; Timp, W; Moccio, S V; Garno, J P; Kleiman, R N
Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips Journal Article
In: Applied Physics Letters, vol. 74, no. 24, pp. 3672–3674, 1999, ISSN: 0003-6951.
@article{omalley_electrical_1999b,
title = {Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips},
author = {M L O’Malley and G L Timp and W Timp and S V Moccio and J P Garno and R N Kleiman},
url = {https://aip.scitation.org/doi/abs/10.1063/1.123217},
doi = {10.1063/1.123217},
issn = {0003-6951},
year = {1999},
date = {1999-06-01},
urldate = {2019-04-27},
journal = {Applied Physics Letters},
volume = {74},
number = {24},
pages = {3672--3674},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
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