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101 entries « 3 of 3 »

1999

O’Malley, M L; Timp, G L; Timp, W; Moccio, S V; Garno, J P; Kleiman, R N

Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips Journal Article

In: Applied Physics Letters, vol. 74, no. 24, pp. 3672–3674, 1999, ISSN: 0003-6951.

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101 entries « 3 of 3 »